De La Iglesia, B.,
Nawongs, K.,
Dainty, J. R. &
Macgregor, A.,
28 Oct 2022,
IEEE MetroXRAINE 2022: Proceedings of 2022 IEEE International Conference on Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering. Rome:
The Institute of Electrical and Electronics Engineers (IEEE),
p. 444-448 5 p. (2022 IEEE International Workshop on Metrology for Extended Reality, Artificial Intelligence and Neural Engineering, MetroXRAINE 2022 - Proceedings).
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution