De La Iglesia, B.
, Nawongs, K.
, Dainty, J. R.
& Macgregor, A.
, 28 Oct 2022
, IEEE MetroXRAINE 2022: Proceedings of 2022 IEEE International Conference on Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering.
Rome: The Institute of Electrical and Electronics Engineers (IEEE)
, p. 444-448 5 p.
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution