Computer-aided thermal analysis of reverse-biased PIN diodes

D. de Cogan, S. A. John

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	170
Number of pages	1
Journal	IEE Proceedings I: Solid-State and Electron Devices
Volume	132
Issue number	3
DOIs	https://doi.org/10.1049/ip-i-1:19850035
Publication status	Published - Jun 1985

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@article{4f063444b7e0427d92f349220e818079,

title = "Computer-aided thermal analysis of reverse-biased PIN diodes",

author = "{de Cogan}, D. and John, {S. A.}",

year = "1985",

month = jun,

doi = "10.1049/ip-i-1:19850035",

language = "English",

volume = "132",

pages = "170",

journal = "IEE Proceedings I: Solid-State and Electron Devices",

issn = "0143-7100",

publisher = "Institution of Electrical Engineers (IEE)",

number = "3",

}