Detecting Cognitive Decline Using a Novel Doodle-Based Neural Network

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publicationProceedings of the 2022 IEEE International Workshop on Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering - IEEE MetroXRAINE 2022
PublisherThe Institute of Electrical and Electronics Engineers (IEEE)
Publication statusAccepted/In press - 21 Jul 2022
Event2022 IEEE International Workshop on Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering - Rome, Italy
Duration: 26 Oct 202228 Oct 2022

Conference

Conference2022 IEEE International Workshop on Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering
Abbreviated titleIEEE MetroXRAINE 2022
Country/TerritoryItaly
CityRome
Period26/10/2228/10/22

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