dv/dt Dependence in metal oxide varistors

D. de Cogan, M. Leesen

Research output: Contribution to journalArticlepeer-review

1 Citation (Scopus)


A dv/dt dependence has been observed in metal oxide varis-tors during impulse testing. A lossy dielectric model which provides a qualitative explanation of this behaviour can also be used to account for current overshoot.
Original languageEnglish
Pages (from-to)950-952
Number of pages3
JournalIEE Electronics Letters
Issue number18
Publication statusPublished - Aug 1986

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