Abstract
A dv/dt dependence has been observed in metal oxide varis-tors during impulse testing. A lossy dielectric model which provides a qualitative explanation of this behaviour can also be used to account for current overshoot.
| Original language | English |
|---|---|
| Pages (from-to) | 950-952 |
| Number of pages | 3 |
| Journal | IEE Electronics Letters |
| Volume | 22 |
| Issue number | 18 |
| DOIs | |
| Publication status | Published - Aug 1986 |