dv/dt Dependence in metal oxide varistors

D. de Cogan; M. Leesen

doi:10.1049/el:19860648

dv/dt Dependence in metal oxide varistors

D. de Cogan, M. Leesen

School of Computing Sciences

Research output: Contribution to journal › Article › peer-review

1 Citation (Scopus)

Abstract

A dv/dt dependence has been observed in metal oxide varis-tors during impulse testing. A lossy dielectric model which provides a qualitative explanation of this behaviour can also be used to account for current overshoot.

Original language	English
Pages (from-to)	950-952
Number of pages	3
Journal	IEE Electronics Letters
Volume	22
Issue number	18
DOIs	https://doi.org/10.1049/el:19860648
Publication status	Published - Aug 1986

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10.1049/el:19860648

http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=4256855

Cite this

@article{64058b68cddc4ffd9ffe68ebbc70e7a2,

title = "dv/dt Dependence in metal oxide varistors",

abstract = "A dv/dt dependence has been observed in metal oxide varis-tors during impulse testing. A lossy dielectric model which provides a qualitative explanation of this behaviour can also be used to account for current overshoot.",

author = "{de Cogan}, D. and M. Leesen",

year = "1986",

month = aug,

doi = "10.1049/el:19860648",

language = "English",

volume = "22",

pages = "950--952",

journal = "IEE Electronics Letters",

issn = "0013-5194",

publisher = "Institution of Engineering and Technology",

number = "18",

}

TY - JOUR

T1 - dv/dt Dependence in metal oxide varistors

AU - de Cogan, D.

AU - Leesen, M.

PY - 1986/8

Y1 - 1986/8

N2 - A dv/dt dependence has been observed in metal oxide varis-tors during impulse testing. A lossy dielectric model which provides a qualitative explanation of this behaviour can also be used to account for current overshoot.

AB - A dv/dt dependence has been observed in metal oxide varis-tors during impulse testing. A lossy dielectric model which provides a qualitative explanation of this behaviour can also be used to account for current overshoot.

U2 - 10.1049/el:19860648

DO - 10.1049/el:19860648

M3 - Article

SN - 0013-5194

VL - 22

SP - 950

EP - 952

JO - IEE Electronics Letters

JF - IEE Electronics Letters

IS - 18

ER -