How to measure patent thickets--A novel approach

Georg Von Graevenitz, Stefan Wagner, Dietmar Harhoff

Research output: Contribution to journalArticlepeer-review

55 Citations (Scopus)
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Abstract

The existing literature identifies patent thickets indirectly. In this paper we propose a novel measure based on patent citations which allows us to measure the density of patent thickets directly. We discuss the algorithm which generates the measure and present descriptive results validating it. Moreover, we identify technology areas which are particularly impacted by patent thickets.
Original languageEnglish
Pages (from-to)6-9
Number of pages4
JournalEconomics Letters
Volume111
Issue number1
Publication statusPublished - Apr 2011

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