Prediciting Cone Quantum Catches Under Illumination Change

G. D. Finlayson, B. V. Funt, H. Jiang

Research output: Contribution to conferencePaper

Abstract

Given LMS cone quantum catches from a surface under a first illuminant what is the best method of predicting what the corresponding quantum catches will be for the same surface under a second illuminant given only the quantum catches of a white surface under both illuminants? The von Kries rule is one well known method. In this paper, two new prediction methods along with a variation on an existing third method are introduced and then compared experimentally. In contrast to the von Kries rule which is equivalent to a diagonal transformation, all three methods estimate a full 3-by-3 linear transformation mapping LMS values between illuminants. All the new methods perform better than the von Kries rule.
Original languageEnglish
Pages170-174
Number of pages5
Publication statusPublished - Nov 2003
Event11th Color Imaging Conference: Color Science and Engineering Systems, Technologies, and Applications - Scottsdale, United States
Duration: 1 Nov 2003 → …

Conference

Conference11th Color Imaging Conference: Color Science and Engineering Systems, Technologies, and Applications
Country/TerritoryUnited States
CityScottsdale
Period1/11/03 → …

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