Abstract
Given LMS cone quantum catches from a surface under a first illuminant what is the best method of predicting what the corresponding quantum catches will be for the same surface under a second illuminant given only the quantum catches of a white surface under both illuminants? The von Kries rule is one well known method. In this paper, two new prediction methods along with a variation on an existing third method are introduced and then compared experimentally. In contrast to the von Kries rule which is equivalent to a diagonal transformation, all three methods estimate a full 3-by-3 linear transformation mapping LMS values between illuminants. All the new methods perform better than the von Kries rule.
Original language | English |
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Pages | 170-174 |
Number of pages | 5 |
Publication status | Published - Nov 2003 |
Event | 11th Color Imaging Conference: Color Science and Engineering Systems, Technologies, and Applications - Scottsdale, United States Duration: 1 Nov 2003 → … |
Conference
Conference | 11th Color Imaging Conference: Color Science and Engineering Systems, Technologies, and Applications |
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Country/Territory | United States |
City | Scottsdale |
Period | 1/11/03 → … |