Abstract
Transmission Line Matrix (TLM) is a numerical technique which can be used to simulate wide range of physical process. In the area of semiconductor device modeling the correct choice of electromagnetic analogue can have a strong influence on the stability, accuracy and efficiency of algorithms. This paper reviews recent progress in TLM with particular attention to the drift-diffusion process in carrier transport in semiconductors.
Original language | English |
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Pages | 274-286 |
Number of pages | 13 |
DOIs | |
Publication status | Published - 1997 |
Event | SPIE Proceedings, Solid State Crystals in Optoelectronics and Semiconductor Technology - Zakopane, Poland Duration: 7 Oct 1996 → … |
Conference
Conference | SPIE Proceedings, Solid State Crystals in Optoelectronics and Semiconductor Technology |
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Country/Territory | Poland |
City | Zakopane |
Period | 7/10/96 → … |