Regression models for classification to enhance interpretability

K. K. Lee; C. J. Harris; S. R. Gunn; P. A. S. Reed

Regression models for classification to enhance interpretability

K. K. Lee
, C. J. Harris
, S. R. Gunn
, P. A. S. Reed

School of Computing Sciences

Research output: Contribution to conference › Paper

Original language	English
Publication status	Published - 2001
Event	3rd International Conference on Intelligent Processing and Manufacturing of Materials (IPMM) - Vancouver, Canada Duration: 29 Jul 2001 → 3 Aug 2001

Conference

Conference	3rd International Conference on Intelligent Processing and Manufacturing of Materials (IPMM)
Country/Territory	Canada
City	Vancouver
Period	29/07/01 → 3/08/01

Cite this

@conference{fe4fd05556ac4163b31631102988565f,

title = "Regression models for classification to enhance interpretability",

author = "Lee, \{K. K.\} and Harris, \{C. J.\} and Gunn, \{S. R.\} and Reed, \{P. A. S.\}",

year = "2001",

language = "English",

note = "3rd International Conference on Intelligent Processing and Manufacturing of Materials (IPMM) ; Conference date: 29-07-2001 Through 03-08-2001",

}