RFID-based colored Petri net applied for quality monitoring in manufacturing system

Y. Lv, C. K. M. Lee, H. K. Chan, W. H. Ip

Research output: Contribution to journalArticlepeer-review

19 Citations (Scopus)
Original languageEnglish
Pages (from-to)225-236
Number of pages12
JournalInternational Journal of Advanced Manufacturing Technology
Volume60
Issue number1-4
DOIs
Publication statusPublished - Apr 2012

Keywords

  • Colored Petri net modeling
  • Manufacturing process
  • Process quality control
  • Product quality monitoring
  • Real-time analysis
  • RFID

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