Single-mode—multimode—single-mode and lossy mode resonance-based devices: a comparative study for sensing applications

Abian Bentor Socorro; Miguel Hernaez; Ignacio Del Villar; Jesús María Corres; Francisco Javier Arregui; Ignacio Raul Matias

doi:10.1007/s00542-015-2793-z

Single-mode—multimode—single-mode and lossy mode resonance-based devices: a comparative study for sensing applications

Abian Bentor Socorro (Lead Author), Miguel Hernaez, Ignacio Del Villar, Jesús María Corres, Francisco Javier Arregui, Ignacio Raul Matias

Research output: Contribution to journal › Article › peer-review

10 Citations (Scopus)

Abstract

In this work, a thin-film consisting of 15 bilayers (estimated thickness: 210 nm) of titanium (IV) oxide and poly(sodium 4-styrenesulfonate) is simultaneously deposited onto two optical fiber structures: a single-mode—multimode—single-mode (SMS) device and a lossy mode resonance (LMR)-based device. The performance of both structures, as refractometers and relative humidity sensors, is studied and compared. In both cases, the sensitivity of the LMR-based device (955 nm/RIU and 3.54 nm/RH %, respectively) highly improves the one of the SMS (142 nm/RIU and 0.3 nm/RH %). These facts can be taken into account when developing sensors based on either SMS or LMR technologies.

Original language	English
Pages (from-to)	1633-1638
Number of pages	6
Journal	Microsystem Technologies
Volume	22
Issue number	7
Early online date	31 Dec 2015
DOIs	https://doi.org/10.1007/s00542-015-2793-z
Publication status	Published - Jul 2016

Keywords

Wavelength Shift
Refractive Index Change
Evanescent Field
Electronic Sensor
Resonant Phenomenon

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10.1007/s00542-015-2793-z

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title = "Single-mode—multimode—single-mode and lossy mode resonance-based devices: a comparative study for sensing applications",

abstract = "In this work, a thin-film consisting of 15 bilayers (estimated thickness: 210 nm) of titanium (IV) oxide and poly(sodium 4-styrenesulfonate) is simultaneously deposited onto two optical fiber structures: a single-mode—multimode—single-mode (SMS) device and a lossy mode resonance (LMR)-based device. The performance of both structures, as refractometers and relative humidity sensors, is studied and compared. In both cases, the sensitivity of the LMR-based device (955 nm/RIU and 3.54 nm/RH %, respectively) highly improves the one of the SMS (142 nm/RIU and 0.3 nm/RH %). These facts can be taken into account when developing sensors based on either SMS or LMR technologies.",

keywords = "Wavelength Shift, Refractive Index Change, Evanescent Field, Electronic Sensor, Resonant Phenomenon",

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language = "English",

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journal = "Microsystem Technologies",

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Single-mode—multimode—single-mode and lossy mode resonance-based devices : a comparative study for sensing applications. / Socorro, Abian Bentor (Lead Author); Hernaez, Miguel; Del Villar, Ignacio; Corres, Jesús María; Arregui, Francisco Javier; Matias, Ignacio Raul.

In: Microsystem Technologies, Vol. 22, No. 7, 07.2016, p. 1633-1638.

Research output: Contribution to journal › Article › peer-review

TY - JOUR

T1 - Single-mode—multimode—single-mode and lossy mode resonance-based devices

T2 - a comparative study for sensing applications

AU - Socorro, Abian Bentor

AU - Hernaez, Miguel

AU - Del Villar, Ignacio

AU - Corres, Jesús María

AU - Arregui, Francisco Javier

AU - Matias, Ignacio Raul

PY - 2016/7

Y1 - 2016/7

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AB - In this work, a thin-film consisting of 15 bilayers (estimated thickness: 210 nm) of titanium (IV) oxide and poly(sodium 4-styrenesulfonate) is simultaneously deposited onto two optical fiber structures: a single-mode—multimode—single-mode (SMS) device and a lossy mode resonance (LMR)-based device. The performance of both structures, as refractometers and relative humidity sensors, is studied and compared. In both cases, the sensitivity of the LMR-based device (955 nm/RIU and 3.54 nm/RH %, respectively) highly improves the one of the SMS (142 nm/RIU and 0.3 nm/RH %). These facts can be taken into account when developing sensors based on either SMS or LMR technologies.

KW - Wavelength Shift

KW - Refractive Index Change

KW - Evanescent Field

KW - Electronic Sensor

KW - Resonant Phenomenon

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JF - Microsystem Technologies

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ER -

Single-mode—multimode—single-mode and lossy mode resonance-based devices: a comparative study for sensing applications

Abstract

Keywords

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Miguel Hernaez

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