Abstract
The problem of extracting spots from DNA microarrays is a problem of considerable scientific and economic utility. In this paper we introduce a new approach based on a scale-space analysis of the image. We augment this with a machine learning system that guides an operator by classifying spots into those that require further attention and those that are already segmented correctly. We compare conventional k-nearest neighbor techniques with generalized linear models and multilayer perceptrons using confidence intervals and McNemar's test.
Original language | English |
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Pages | 2934-2939 |
Number of pages | 6 |
DOIs | |
Publication status | Published - 2003 |
Event | IEEE/INNS International Joint Conference on Artificial Neural Networks - Portland, United States Duration: 20 Jul 2003 → 24 Jul 2003 |
Conference
Conference | IEEE/INNS International Joint Conference on Artificial Neural Networks |
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Abbreviated title | IJCNN-2003 |
Country/Territory | United States |
City | Portland |
Period | 20/07/03 → 24/07/03 |