The problem of extracting spots from DNA microarrays is a problem of considerable scientific and economic utility. In this paper we introduce a new approach based on a scale-space analysis of the image. We augment this with a machine learning system that guides an operator by classifying spots into those that require further attention and those that are already segmented correctly. We compare conventional k-nearest neighbor techniques with generalized linear models and multilayer perceptrons using confidence intervals and McNemar's test.
Original languageEnglish
Number of pages6
Publication statusPublished - 2003
EventIEEE/INNS International Joint Conference on Artificial Neural Networks - Portland, United States
Duration: 20 Jul 200324 Jul 2003


ConferenceIEEE/INNS International Joint Conference on Artificial Neural Networks
Abbreviated titleIJCNN-2003
Country/TerritoryUnited States

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