Abstract
The problem of extracting spots from DNA microarrays is a problem of considerable scientific and economic utility. In this paper we introduce a new approach based on a scale-space analysis of the image. We augment this with a machine learning system that guides an operator by classifying spots into those that require further attention and those that are already segmented correctly. We compare conventional k-nearest neighbor techniques with generalized linear models and multilayer perceptrons using confidence intervals and McNemar's test.
| Original language | English |
|---|---|
| Pages | 2934-2939 |
| Number of pages | 6 |
| DOIs | |
| Publication status | Published - 2003 |
| Event | IEEE/INNS International Joint Conference on Artificial Neural Networks - Portland, United States Duration: 20 Jul 2003 → 24 Jul 2003 |
Conference
| Conference | IEEE/INNS International Joint Conference on Artificial Neural Networks |
|---|---|
| Abbreviated title | IJCNN-2003 |
| Country/Territory | United States |
| City | Portland |
| Period | 20/07/03 → 24/07/03 |
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